Nature Of The Silicon And Silicon Dioxide Surfaces During Plasma Etching With Fluorocarbon Containing Discharges
作者
Eray S. Aydil,D. C. Marra
标识
DOI:10.1109/imnc.1998.729911
摘要
Plasma etching of silicon dioxide using fluorocarbon gas containing discharges is an important process in integrated circuit manufacturing. Except for subtle differences, many gas mixtures that contain fluorocarbon gases such as CnF2n+2(n>0) and CHF3 exhibit similar etching behavior.