单层
光探测
薄脆饼
化学气相沉积
材料科学
响应度
光电子学
基质(水族馆)
纳米技术
硅
光电探测器
海洋学
地质学
作者
Lixuan Liu,Kun Ye,Zhipeng Yu,Zhiyan Jia,Jianyong Xiang,Anmin Nie,Wenjun Ruan,Congpu Mu,Bocong Wang,Ying Liu,Yongji Gong,Zhongyuan Liu
出处
期刊:2D materials
[IOP Publishing]
日期:2020-02-06
卷期号:7 (2): 025020-025020
被引量:13
标识
DOI:10.1088/2053-1583/ab6d33
摘要
Monolayer MoS2 is a known candidate to replace silicon-based materials for photodetection purposes. Achieving industrial production and application of MoS2 calls for efficient and economic synthesis of such material. Here, we report a one-step and low-cost chemical vapor deposition method for the controlled synthesis of high quality and uniform wafer-scale (approximately 9.5 × 4.5 cm) monolayer MoS2 film on SiO2/Si substrates. Using the as-synthesized MoS2 films, MoS2/PbS quantum dot hybrid device arrays are also fabricated. These hybrid devices have broad spectral photoresponse (457–1064 nm), rapid response rate, high responsivity of approximately 1.8 × 104 A W−1, and ultrahigh detectivity of approximately 7.6 × 1013 Jones, which outperforms other pristine two-dimensional as well as commercial Si and InGaAs materials. This low-cost and efficient method of growing wafer-scale monolayer MoS2, as well as the excellent performance of its hybrid device arrays, will strongly support the production and application of monolayer MoS2 in the future.
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