光探测
窄带
光电探测器
光电子学
钻石
材料科学
光学
放射发光
物理
探测器
闪烁
复合材料
作者
Lemin Jia,Lu Cheng,Wei Zheng
出处
期刊:Opto-electronic science
[Opto-Electronic Advances]
日期:2023-01-01
卷期号:2 (7): 230010-230010
被引量:29
标识
DOI:10.29026/oes.2023.230010
摘要
Spectrally-selective photodetection plays a crucial role in various applications, including target imaging and environmental monitoring. Traditional deep-ultraviolet (DUV) narrowband photodetection systems consist of broadband photodetectors and filters, which complicates the architecture and constrains imaging quality. Here, we introduce an electronic-grade diamond single-crystal photodetector exhibiting an exceptionally narrow spectral response in the DUV range with a full width at half maximum of 8 nm. By examining diamond photodetectors with varying dislocation densities, we propose that mitigating the defect-induced trapping effect to achieve charge collection narrowing, assisted by free exciton radiative recombination, is an effective strategy for narrowband photodetection. The superior performance of this device is evidenced through the imaging of DUV light sources, showcasing its capability to differentiate between distinct light sources and monitor human-safe sterilization systems. Our findings underscore the promising potential applications of electronic-grade diamond in narrowband photodetection and offer a valuable technique for identifying electronic-grade diamond.
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