高功率脉冲磁控溅射
薄膜
分析化学(期刊)
离子
材料科学
溅射沉积
电离
基质(水族馆)
电流密度
化学计量学
沉积(地质)
脉冲(物理)
脉冲激光沉积
腔磁控管
溅射
化学
纳米技术
物理
色谱法
沉积物
有机化学
古生物学
地质学
量子力学
海洋学
生物
作者
Niklas Hellgren,Igor Zhirkov,Maurício A. Sortica,Andrejs Petruhins,Grzegorz Greczyński,Lars Hultman,Johanna Rosén
出处
期刊:Vacuum
[Elsevier BV]
日期:2024-02-20
卷期号:222: 113070-113070
被引量:4
标识
DOI:10.1016/j.vacuum.2024.113070
摘要
We report on a systematic study of the effect of pulse length (ton=25−200μs), and peak target current density (JT,peak=0.25−2.0A/cm2) during HiPIMS deposition of AlB2-phase TiBx thin films from a TiB2 target at a pressure of pAr=1.33Pa(10mTorr) and substrate temperature Ts=500°C. All films are under-stoichiometric with B/Ti = 1.36–1.89, with the higher values corresponding to longer pulses and higher JT,peak values. While the deposition flux, including both ions and neutrals, in general increases with increasing ton and JT,peak, the Ti+ ion flux saturates, resulting in the higher B/Ti values under these conditions. Thus, the relative amount of Ti ionization, and the degree to which these ions are guided toward the substrate by magnetic fields, are main modulators determining the composition of TiBx thin films.
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