XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation.

Journal Article XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation. Get access D Surman, D Surman Kratos Analytical Inc., 100 Red Schoolhouse Road, Chestnut Ridge, NY Search for other works by this author on: Oxford Academic Google Scholar C Moffitt, C Moffitt Kratos Analytical Inc., 100 Red Schoolhouse Road, Chestnut Ridge, NY Search for other works by this author on: Oxford Academic Google Scholar A J Roberts, A J Roberts Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK Search for other works by this author on: Oxford Academic Google Scholar S J Coultas, S J Coultas Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK Search for other works by this author on: Oxford Academic Google Scholar J D P Counsell, J D P Counsell Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK Search for other works by this author on: Oxford Academic Google Scholar C J Blomfield C J Blomfield Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 380–381, https://doi.org/10.1017/S1431927616002750 Published: 25 July 2016