折射率
光学
材料科学
隐形眼镜
干涉测量
镜头(地质)
压扁
相(物质)
波长
X射线光学
色散(光学)
光学相干层析成像
光电子学
物理
复合材料
X射线
量子力学
作者
Todd Szarlan,Donald Gibson,Xin Wei,Filipp V. Ignatovich
出处
期刊:Optics Express
[The Optical Society]
日期:2020-03-19
卷期号:28 (8): 10818-10818
被引量:5
摘要
We describe a measurement approach for the bulk phase refractive index of hydrogel and silicone hydrogel (soft) contact lenses in solution at multiple wavelengths with an accuracy of +/- 0.001, and sensitivity to change of 0.0002. The method uses time-domain low-coherence interferometry to obtain group refractive index (GRI) for contact lenses between 530 to 670 nm in 10 nm increments. The measured GRI dispersion curve is then mathematically converted to the phase refractive index values. The approach is based on a point measurement using focused beam, and therefore does not require flattening of the lens for the measurements. We discuss practical implications of the method for the quality control in manufacturing of ophthalmic optics.
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