单层
埃
同步加速器
接触角
材料科学
X射线反射率
化学物理
分子
光学
分子物理学
反射率
结晶学
物理
纳米技术
化学
复合材料
量子力学
作者
Adelé Poynor,Liang Hong,Ian Robinson,Steve Granick,Zhan Zhang,Paul Fenter
标识
DOI:10.1103/physrevlett.97.266101
摘要
Synchrotron x-ray reflectivity measurements of the interface between water and methyl-terminated octadecylsilane monolayers with stable contact angle >100 degrees conclusively show a depletion layer, whether or not the water is degassed. The thickness is of order one water molecule: 2-4 Angstrom with electron density <40% that of bulk water. Considerations of coherent and incoherent averaging of lateral inhomogeneities show that the data cannot be explained by "nanobubbles." When the contact angle is lower, unstable in time, or when monolayers fail to be sufficiently smooth over the footprint of the x-ray beam, there is no recognizable depletion.
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