钝化
材料科学
量子点
卤化物
衍射
光致发光
化学物理
配体(生物化学)
兴奋剂
八面体
红外线的
胶体
光电子学
金属
结晶学
凝聚态物理
外延
表面状态
载流子寿命
协调数
纳米技术
半导体
格子(音乐)
胶体晶体
粉末衍射
X射线晶体学
红外光谱学
分子物理学
钙钛矿(结构)
配位复合体
作者
Zhourui Hu,J J Liu,Yilu Qin,Yi Long,Lingfeng Ye,Na Lin,Yunxiang Di,Meikang Han,Gang Zhou,Kun Ba,Yan Chen,Xudong Wang,Tianle Guo,J. H. Chu,Jianlu Wang
摘要
ABSTRACT Surface trap‐induced carrier doping currently hinders colloidal quantum dots (CQDs) from approaching the electronic purity of epitaxial semiconductors, particularly in the mid‐wave infrared (MWIR) regime, where low dark noise is critical. Here, we demonstrate that the coordination geometry of the metal halide precursor strongly influences passivation efficacy, suppressing background carrier densities to an intrinsic level (∼10 14 cm −3 ). Mechanistic investigation reveals that the octahedral geometry of HgBr 2 facilitates the formation of a stable HgBr 2 (Olam) 4 complex, as traced by the correlated evolution of chemical shifts in 1 H NMR and diffraction patterns in powder X‐ray diffraction (pXRD). This behavior contrasts with the linear lattice of HgCl 2 , where the absence of comparable spectral evolution indicates much weaker ligand coordination. Consequently, the stable complex is structurally inherited by the HgTe CQDs, yielding a high surface halide coverage of ∼9 at.%, whereas HgCl 2 results in halide‐deficient surfaces (<1 at.%). This robust passivation effectively suppresses non‐radiative recombination, consistent with improved carrier decay dynamics in time‐resolved photoluminescence (TRPL). Cross‐verification via field‐effect transistor (FET), capacitance‐voltage (C‐V), and Hall measurements confirms substantially reduced background doping, highlighting coordination engineering as an effective strategy for achieving electronic purity in solution‐processed optoelectronics.
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