光探测
材料科学
光电子学
纳秒
量子点
二极管
光电二极管
光子学
红外线的
比探测率
光电探测器
双功能
堆栈(抽象数据类型)
发光二极管
量子效率
光通信
光学
响应时间
雪崩光电二极管
近红外光谱
上升时间
量子点激光器
作者
Yu‐Hao Deng,Dobromił Respekta,Jing Bai,Korneel Molkens,Ezat Kheradmand,Chao Pang,Robin Petit,Pepijn Verscheure,Philippe B. Green,Elaheh Teymouri,Christophe Detavernier,Dries Van Thourhout,Pieter Geiregat,Zeger Hens
摘要
ABSTRACT Short‐wave infrared (SWIR) technologies are vital for optical communication, all‐weather imaging, and advanced spectroscopy. Using a single diode for light detection and emission can reduce device footprints, lower cost and enable fast, bidirectional communication. However, dual detection/emission operation often involves incompatible choices of material and stack design, which result in devices with inferior performance. Here, we introduce a bifunctional PbS QD diode stack that achieves, for the first time, nanosecond‐fast photodetection and emission in a single SWIR device. Using thin active layers with high charge‐carrier mobility and compact geometries, we demonstrate a record 2 ns response in photodiode (QDPD) mode and 11.7 ns rise time/6.5 ns fall time in light‐emitting diode (QDLED) mode. This high‐speed operation is combined with a 49% external quantum efficiency (EQE) and 2.6 × 10 1 2 cm·Hz 0 . 5 ·W − 1 detectivity for QDPD operation, while the QDLED reaches 8.1% EQE. These high‐speed, compact devices unify imaging and detection with a single, CMOS‐compatible platform, and set the stage for integrated SWIR photonics and bidirectional optical interconnects. This work demonstrates the potential of QDs to unify imaging, detection, and communication in a single materials platform.
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