X射线光电子能谱
铂金
材料科学
薄膜
铜
分析化学（期刊）
谱线
激发
退火（玻璃）
X射线
化学
冶金
核磁共振
光学
纳米技术
物理
催化作用
量子力学
生物化学
色谱法
天文
作者
Sergio A. Rincón‐Ortiz,Jorge H. Quintero‐Orozco,Rogelio Ospina
摘要
Pt thin film was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.3 eV) excitation source. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. The survey spectrum, Pt 3d, Pt 4f, Pt 4d, C 1s, and valence band core levels spectra were acquired.
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