Interfacial-Mixing and Band Engineering Induced by Annealing of CdS and a-Ga2O3 n–n-Type Thin-Film Heterojunction and Its Impact on Carrier Dynamics for High-Performance Solar-Blind Photodetection

异质结 材料科学 退火(玻璃) 光电流 光电子学 带材弯曲 X射线光电子能谱 带偏移量 无定形固体 带隙 价带 化学 结晶学 物理 核磁共振 复合材料
作者
Damanpreet Kaur,Riya Wadhwa,Nisika Nisika,Yuchen Zhang,Poojan Indrajeet Kaswekar,Qiquan Qiao,Anju Sharma,Mark D. Poliks,Mukesh Kumar
出处
期刊:ACS applied electronic materials [American Chemical Society]
卷期号:5 (7): 3798-3808 被引量:8
标识
DOI:10.1021/acsaelm.3c00527
摘要

Heterojunctions of dissimilar materials are increasingly being used in optoelectronics for their superior properties. However, the heart of the heterojunction─its interface─and its impact on the device performance are seldom studied in detail. Herein, we report on the band alignment modification of heterojunction formed between amorphous Ga2O3 and CdS, two intrinsically n-type materials, with high optical absorbance but different band gaps. The resultant heterostructure-based devices remain solar-blind and outperform the singular bare photodetectors. To further improve upon device performance, the heterostructure is subjected to a moderate annealing of 300 °C. The annealed heterojunction device shows a reduction in dark current by more than 1 order of magnitude along with an enhanced photocurrent. The response time of the devices reduces from 1.35 s/2.87 s (rise/fall time) to about 0.38 s/0.75 s upon annealing. To study this change in the device performance between the pristine and the annealed interface, the two heterojunctions are compared using X-ray photoelectron spectroscopy depth profiling, and results show that the pristine heterostructure has a sharp interface whereas upon annealing, it leads to a sort of diffuse interface. This produces a reduced valence band offset, resulting in a change in the band alignment from type II to type I. The carrier dynamics across the two interfaces therefore changes and is further validated using Kelvin probe force microscopy. This study reveals how the change at the interface by mere annealing can lead to a huge alteration in the band alignment and thus, the carrier dynamics, thereby completely altering the ultimate device performance.
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