电容器
电介质
材料科学
薄膜
储能
薄膜电容器
电容感应
铁电性
光电子学
离子
数码产品
工程物理
纳米技术
电气工程
功率(物理)
电压
化学
物理
工程类
量子力学
有机化学
作者
Jieun Kim,Sahar Saremi,Megha Acharya,Gabriel Velarde,Eric Parsonnet,C. Donahue,Alexander Qualls,David García,Lane W. Martin
出处
期刊:Science
[American Association for the Advancement of Science]
日期:2020-07-02
卷期号:369 (6499): 81-84
被引量:303
标识
DOI:10.1126/science.abb0631
摘要
Defect-enhanced energy storage Dielectric capacitors are vital components of electronics and power systems. The thin-film materials of which capacitors are composed are usually optimized by changing the material composition. However, Kim et al. found that postprocessing an already effective thin-film dielectric by high-energy ion bombardment further improved the material because of the introduction of specific types of defects that ultimately improved the energy storage performance. The results suggest that postprocessing may be important for developing the next generation of capacitors. Science , this issue p. 81
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