非易失性存储器
非易失性随机存取存储器
半导体存储器
计算机科学
可靠性(半导体)
实现(概率)
内存刷新
感测放大器
计算机硬件
嵌入式系统
电气工程
计算机存储器
工程类
物理
功率(物理)
统计
数学
量子力学
作者
Yoshio Nishi,Hisakazu Iizuka
标识
DOI:10.7567/jjaps.16s1.191
摘要
Present state of the art of nonvolatile semiconductor memory has been reviewed for the MIOS-type and the floating gate-type devices. The MIOS devices are mostly applied to implement an electrically alterable read only memory (EAROM) and a nonvolatile read write random access memory (NVRAM), where several problems related to the mechanism of operations and reliability have been pointed out and also solved in part. The floating gate devices are most suitable for realization of erasable read only memory by the better retentivity. A number of approaches to improve writing/erasing operations for both types of devices have been discussed in connection with future applicability of the devices.
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