A Self‐contained Trimmable Low Quiescent Current Overvoltage Detector

This paper presents a low‐power self‐contained overvoltage detector. Compared with conventional detectors that consist of stacked Zener diodes, the proposed structure can trim the threshold with binary codes to accommodate system‐level changes. The proposed structure enables trimming by adding a decoder, a biasing circuit, and switches in parallel with Zener diodes. The newly configured structure forms a standalone detector that can operate independently and be powered from the supply under detection with negligible current addition. The proposed structure is applicable to any high‐voltage process that contains N‐type isolation layer and needs no high‐voltage device. The proposed circuit with three bits adjustment circuit was fabricated in a 0.18 μm Bipolar‐CMOS‐DMOS (BCD) process, the overvoltage threshold can be adjusted from 8 to 38 V with post trim variation of ±2.5 V. The measured quiescent current was around 0 μA at 10 V and 28 μA at 38 V, which was comparable to the current consumption in a conventional structure with 38 V overvoltage threshold. © 2022 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC.