微通道
热成像
散热片
温度测量
材料科学
沸腾
红外线的
校准
热交换器
光学
热力学
纳米技术
物理
量子力学
作者
Daniel Krebs,Vinod Narayanan,James A. Liburdy,Deborah V. Pence
摘要
Quantitative measurement of channel wall temperature in two-phase microchannel flows using infrared thermography is discussed. In particular, the top channel wall temperature of a branching microchannel silicon heat sink is presented. Quantitative temperature measurements require several considerations in the design and fabrication of the heat sink and test facility, in calibration, and in data analysis; each of these are discussed. Temperature measurements, with a spatial resolution of 10 μm, are presented over an 18 mm × 18 mm area of the heat sink during flow boiling.
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