钻石
抛光
化学机械平面化
材料科学
表面粗糙度
试剂
Crystal(编程语言)
表面光洁度
单晶
人造金刚石
复合材料
冶金
纳米技术
化学
结晶学
计算机科学
物理化学
程序设计语言
作者
Zhuo Shi,Zhu Ji Jin,Hong Ming Xue,Shuang Shi
出处
期刊:Advanced Materials Research
[Trans Tech Publications]
日期:2014-10-01
卷期号:1027: 80-83
被引量:12
标识
DOI:10.4028/www.scientific.net/amr.1027.80
摘要
Single crystal diamond is widely used in high-tech fields for its remarkable performance on mechanics, calorifics, optics, acoustics, etc. High-quality diamond surface with small roughness and low scathe are required in these applications. However, the extreme hardness and high chemical inertness of diamond result in severe processing difficulties. Chemical mechanical polishing (CMP) is a promising processing method which can obtain super-smooth and low-damage diamond surface. Oxidant is a key issue for CMP of single crystal diamond. In this study, five different oxidants were used to polish diamond samples. The results indicated that Fenton reagent was an appropriate CMP oxidant and a super-smooth diamond surface of Ra 2.4 nm was achieved by using Fenton reagent in CMP.
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