扫描透射电子显微镜
扫描共焦电子显微镜
显微镜
纳米技术
透射电子显微镜
材料科学
计算机科学
光学
物理
出处
期刊:Iii-vs Review
[Elsevier]
日期:2000-07-01
卷期号:13 (4): 40-44
被引量:91
标识
DOI:10.1016/s0961-1290(00)80006-x
摘要
In this article, aimed at the non-specialist microscopist rather than the experienced user, we introduce the fundamentals of Scanning Electron Microscopy and the information that can be gained from this technique. A companion article on Transmission Electron Microscopy will follow in a future issue.
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