消色差透镜
光学
缩放
极化(电化学)
基点
物理
衍射
光学成像
电介质
串扰
计算机科学
微波成像
材料科学
线极化
光电子学
作者
Hongji Duan,Qi Gao,Jinyang Li,Ran Zhang,Yuanyang Lv,Pengzhan Wang,Jian Hu,Xiaomin Liu
标识
DOI:10.1088/1361-6463/ae582e
摘要
Abstract As an advanced optical imaging method, polarization imaging technology introduces polarization dimension information on the basis of traditional imaging. It can simultaneously acquire the polarization characteristics of targets and backgrounds, thereby significantly improving the imaging recognition and analysis capabilities. In this paper, a mid-infrared full-Stokes polarization focal plane zoom metasurface operating in the 4.5–5 μ m waveband is designed. Based on an all-silicon dielectric design, this structure has real-time zoom capability and exhibits lower dispersion and smaller polarization crosstalk compared with the modulation mechanisms of existing zoom metalenses. Simulation results show that the full width at half maximum of the focal spot formed by the metasurface is close to the diffraction limit under different polarization states and wavelengths. With its simple structure and weak crosstalk, this design has broad application prospects in the fields of mid-infrared polarization imaging and optical system integration.
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