光电效应
俄歇效应
电子
原子物理学
螺旋钻
X射线
俄歇电子能谱
辐照
电场
格子(音乐)
物理
核物理学
光学
量子力学
声学
标识
DOI:10.1088/1361-6455/adf9dc
摘要
Abstract This study proposes a simulation model and hypothesis to explain the unusual trends in the ablated crater depth produced by X-ray irradiation. Photoelectrons and Auger electrons are expected to be trapped by the electric field formed by the positively charged lattice in the region irradiated by X-rays. This positively charged lattice was produced by X-ray absorption. These trapped electrons are expected to increase the electron density and lattice temperature, which are important parameter for X-ray ablation. Furthermore, photoelectrons and Auger electrons start to be trapped at different X-ray fluences; that is, these electrons are expected to suddenly increase the electron density and lattice temperature at these different X-ray fluences. Owing to this difference, we expected that photoelectrons and Auger electrons would generate the unusual trend of the crater depth mentioned previously.
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