X射线吸收精细结构
铈
锆
催化作用
材料科学
铂金
氧气储存
氧化铈
价(化学)
氧化物
分析化学(期刊)
无机化学
化学
光谱学
冶金
物理
有机化学
量子力学
生物化学
色谱法
作者
Makoto Hirose,Nozomu Ishiguro,Kei Shimomura,Nicolas Burdet,H. Matsui,Mizuki Tada,Yukio Takahashi
标识
DOI:10.1002/anie.201710798
摘要
Abstract The cerium density and valence in micrometer‐size platinum‐supported cerium–zirconium oxide Pt/Ce 2 Zr 2 O x (x=7–8) three‐way catalyst particles were successfully mapped by hard X‐ray spectro‐ptychography (ptychographic‐X‐ray absorption fine structure, XAFS). The analysis of correlation between the Ce density and valence in ptychographic‐XAFS images suggested the existence of several oxidation behaviors in the oxygen storage process in the Ce 2 Zr 2 O x particles. Ptychographic‐XAFS will open up the nanoscale chemical imaging and structural analysis of heterogeneous catalysts.
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