干涉测量
迈克尔逊干涉仪
光学
激光器
折射率
钕
材料科学
光功率
放大器
光电子学
物理
CMOS芯片
作者
D. Milam,William J. Weber
摘要
An improved time-resolved interferometric method for measuring intensity-dependent changes in the refractive index of optical materials is described. An intense 125-ps pulse from a 1064-nm Nd : YAG laser-glass amplifier system is propagated throguh the sample which is placed in one arm of a modified Michelson interferometer. The nonlinear refractive-index coefficient is measured from the time-dependent fringe formed at the output of the interferometer. Values are reported for several low-index optical glasses (BK-7, FC-5, FK-51), fused silica, a silicate laser glass (ED-2), a Faraday rotator glass (FR-5), and a nonlinear crystal (KH2PO4). Possible sources of error in using this approach are discussed.
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