X-ray crystal interferometers

Various configurations of the X-ray crystal interferometer are reviewed. The interferometer applications considered include metrology, the measurement of fundamental physical constants, the study of weakly absorbing phase objects, time-resolved diagnostics, the determination of hard X-ray beam parameters, and the characterization of structural defects in the context of developing an X-ray Michelson interferometer. The three-crystal Laue interferometer (LLL-interferometer), its design, and the experimental opportunities it offers are given particular attention.