Guy M. Burrow,Matthieu C. R. Leibovici,Thomas K. Gaylord
标识
DOI:10.1364/fio.2012.fw1f.4
摘要
Pattern-integrated interference lithography (PIIL), a new method integrating superposed pattern imaging with interference lithography, is presented. A prototype implementation is used to demonstrate PIIL potential through the single-exposure fabrication of representative photonic crystal structures.