功勋
氧化铟锡
材料科学
制作
薄膜
薄板电阻
透明导电膜
光电子学
溅射
导电体
纳米技术
溅射沉积
表面粗糙度
图层(电子)
复合材料
医学
病理
替代医学
作者
Zhangxian Chen,Wanchao Li,Ran Li,Yunfeng Zhang,Guoqin Xu,Hansong Cheng
出处
期刊:Langmuir
[American Chemical Society]
日期:2013-10-11
卷期号:29 (45): 13836-13842
被引量:341
摘要
Deposition technology of transparent conducting oxide (TCO) thin films is critical for high performance of optoelectronic devices. Solution-based fabrication methods can result in substantial cost reduction and enable broad applicability of the TCO thin films. Here we report a simple and highly effective solution process to fabricate indium-tin oxide (ITO) thin films with high uniformity, reproducibility, and scalability. The ITO films are highly transparent (90.2%) and conductive (ρ = 7.2 × 10(-4) Ω·cm) with the highest figure of merit (1.19 × 10(-2) Ω(-1)) among all the solution-processed ITO films reported to date. The high transparency and figure of merit, low sheet resistance (30 Ω/sq), and roughness (1.14 nm) are comparable with the benchmark properties of dc sputtering and can meet the requirements for most practical applications.
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