材料科学
钌
纳米技术
蚀刻(微加工)
水溶液
硅
互连
光电子学
化学
有机化学
催化作用
计算机网络
计算机科学
图层(电子)
作者
Chien Pin Sherman Hsu,Polly Yi Ting Chen
出处
期刊:Solid State Phenomena
日期:2018-08-01
卷期号:282: 288-292
被引量:4
标识
DOI:10.4028/www.scientific.net/ssp.282.288
摘要
Ruthenium (Ru) is considered for use as a barrier-less metallization interconnect offering low effective resistivity in advanced sub-5nm semiconductor applications. A fully aqueous, environmentally friendly chemistry has been developed for effective Ru etching with broad substrate and metallization compatibilities. This alkaline oxidative chemistry is suitable for versatile etch/clean applications, including highly selective etch of SiGe, Si, Al, W, WNx and other W alloys. Its heavy hydrocarbon and residue removal capability are demonstrated as a Cu/TiN compatible, SPM alternative in multilayer PR/BARC stripping and implant BARC removal.
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