空间光调制器
光学
共焦
材料科学
共焦显微镜
准确度和精密度
液晶
显微镜
镜头(地质)
显微镜
光学(聚焦)
菲涅耳透镜
计量系统
计算机科学
物理
量子力学
天文
出处
期刊:Sensors
[Multidisciplinary Digital Publishing Institute]
日期:2025-04-21
卷期号:25 (8): 2620-2620
摘要
Micro-nano measurement represents a critical engineering focus in the advancement of micro-nano fabrication technologies. Exploring advanced micro-nano measurement methods is a key direction for driving progress in micro-nano manufacturing. This study proposes a confocal measurement method utilizing a liquid crystal spatial light modulator (LC-SLM) to simulate a binary Fresnel lens for 3D focusing, enabling the non-mechanical measurement of spatial positions on sample surfaces. Specifically, it introduces a 3D focusing method based on LC-SLM, constructs a confocal microscopy 3D focusing system, and conducts lateral focusing experiments and axial focusing experiments. Experimental results demonstrate that the system can freely adjust lateral focusing positions. Within an axial focusing range of 900 μm, it achieves axial measurement accuracy exceeding 1 μm, with a maximum resolution capability of approximately 16.667 nm. Compared to similar confocal microscopy systems, this method allows rapid adjustment of lateral focusing positions without regenerating phase grayscale maps, achieves comparable axial measurement accuracy, and enhances measurement speed.
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