响应度
光探测
材料科学
光电子学
光电探测器
分子束外延
接触电阻
电极
Weyl半金属
范德瓦尔斯力
量子效率
电子束光刻
钝化
量子阱
微电子
量子点
纳米技术
凝聚态物理
石墨烯
锡
金属
数码产品
量子
半导体
作者
Biswajit Khan,Santanu Kandar,Taslim Khan,Kritika Bhattacharya,Nahid Chaudhary,Suprovat Ghosh,Pawan Kumar,Rajendra Singh,Samaresh Das
出处
期刊:Small
[Wiley]
日期:2025-10-22
卷期号:21 (46): e04150-e04150
被引量:2
标识
DOI:10.1002/smll.202504150
摘要
Abstract Achieving low contact resistance in advanced quantum electronic devices remains a critical challenge. With the growing demand for faster and energy‐efficient devices, 2D contact engineering offers a promising solution. Beyond graphene, 1T′‐WTe 2 has attracted attention for its excellent electrical transport, quantum phenomena, and Weyl semimetallic properties. Here, the direct wafer‐scale growth of 1T′‐WTe 2 via molecular beam epitaxy (MBE) and its use as a 2D contact for layered materials, such as InSe, are demonstrated. The 1T′‐WTe 2 /InSe interface exhibits a barrier height nearly half that of conventional metal contacts, and its contact resistance is reduced by a factor of 21, effectively suppressing Fermi‐level pinning and enabling efficient electron injection. InSe/1T′‐WTe 2 photodetectors show broad photoresponsivity (0.14–217.58 A W −1 ) under NIR to DUV illumination with fast rise/fall times of 42/126 ms, compared to lower responsivity (8.65 × 10 −4 –3.64 A W −1 ) and slower response (150/144 ms) for InSe/Ti–Au devices. The 1T′‐WTe 2 /InSe devices thus exhibit ≈60 × higher responsivity and ≈4 × faster response than conventional metal contacts. These results establish MBE‐grown 1T′‐WTe 2 as an effective 2D electrode, enhancing photodetection performance while simplifying device architecture, making it a strong candidate for next‐generation nanoelectronic and optoelectronic devices.
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