Imaging XPS for industrial applications

Imaging XPS has been available on commercial XPS instruments since the 1990’s, however its exploitation in the elucidation of surface chemistry has been minimal due to historical limitations in spatial resolution and acquisition times. Major developments in both instrumentation and multivariate data analysis techniques have improved greatly on all these aspects and herein a range of imaging analysis to illustrate the power of XPS imaging to a diverse range of industrial sectors is presented.