Evaluating the accuracy of point spread function deconvolutions applied to luminescence images

Luminescence imaging is a widely used characterization technique for silicon photovoltaics. However, the tools used to acquire images typically utilize a silicon CCD array for detection, which is a poor absorber at silicon luminescence wavelengths. This leads to a smearing effect in the measured image which can be characterized by a point spread function (PSF). If the true PSF is known then the measured image can be restored through deconvolution. Several methods exist for determining a PSF for a particular imaging system and different extraction techniques can lead to variations in the PSF result, yet no studies have provided comprehensive analysis of PSF deconvolution accuracy when applied to luminescence imaging. In this work, several new techniques have been designed and investigated in order to test PSF deconvolution results, with a view to quantifying improvement or errors generated and potentially leading towards improved image restoration.