退火(玻璃)
纹理(宇宙学)
再结晶(地质)
钛
晶粒生长
晶界
作者
Atasi Ghosh,Amit Singh,Nilesh P. Gurao
标识
DOI:10.1016/j.matchar.2017.01.022
摘要
Abstract The evolution of microstructure and texture of commercially pure titanium (CP-Ti) developed by unidirectional rolling (UDR) and multi-step cross rolling (MSCR) followed by annealing treatment at different temperatures was investigated by X-ray bulk texture measurement and electron backscatter diffraction (EBSD) technique. Recrystallisation was complete at about 873 K for both UDR and MSCR samples. In UDR mode, the TD-split type deformation texture remain unchanged whereas in MSCR mode, near basal deformation texture transformed to RD split type basal texture after annealing. This has been attributed to the non-oriented nucleation of recrystallised grains and growth of (0002) 2 ¯ 0 > (major) texture component of the deformed sample by consuming (0002) 1 ¯ 0 > (minor) texture component in UDR. Whereas in MSCR sample, oriented nucleation of (0002) 1 ¯ 0 > and (0002) 2 ¯ 0 > basal texture components occur which compete at the growth stage leading to weak recrystallisation texture compared to UDR. The distinct texture evolution with similar grain size after recrystallisation leads to similar hardness for UDR and MSCR samples.
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