材料科学
基质(水族馆)
图层(电子)
可靠性(半导体)
可制造性设计
光电子学
印刷电路板
电介质
电子工程
电气工程
复合材料
功率(物理)
量子力学
海洋学
物理
地质学
工程类
作者
Tomo Muguruma,Tom Shin,Keita Aoki,Yuya Saeki,Andy Behr,Fumito Suzuki,Hiroaki Umehara,Koji Kishino
标识
DOI:10.1109/ectc51909.2023.00319
摘要
The implementation of 5G technology is expanding well beyond traditional mobile phone applications and paving the way for the internet of everything (IoE). Sustained deployment of high-speed communication systems is contingent on the utilization of higher frequencies and wider bandwidths. For IC packaging designs, these trends mandate higher signal speeds and lower transmission losses. Hence, leading-edge communication modules require chip substrates with better electrical performance, finer traces, and thinner layers to enhance signal speeds. In addition to low transmission loss characteristics, assembly-level reliability is becoming increasingly important for IC substrate materials. A promising option for creating, high-performance, multi-layer substrates is the use of a resin-coated copper foil (RCC) construction to create thinner routing layers on one or both sides of a core material. The RCC approach eliminates glass-cloth in the insulation material, enabling thinner layers. One of the primary requirements for successful implementation of this approach is the development of a complimentary substrate material. Toward this objective, the researchers developed a new highly temperature resistant, ultra-low dielectric system based on a unique Polyphenylene Ether (PPE) polymer which exhibits excellent dielectric properties and enables high-density multi-layer substrate constructions, including fine via pitches and very thin circuit layers. This paper describes the formulation development, as well as testing on mechanical and electrical properties, multi-layer formation, manufacturability, and reliability of substrate test vehicles made with this resin system.
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