Optical resolution enhancement and background reduction by stimulated emission depletion structured illumination microscopy with structured excitation
作者
Fumihiro Dake,Shigeru Nakayama,Yusuke Taki
标识
DOI:10.1364/ntm.2015.nm2c.4
摘要
We propose stimulated emission depletion (STED) structured illumination microscopy (SIM), which has structured excitation and structured STED light with the same grating vector. Numerical simulation shows the possibility of improving resolution and reducing background fluorescence.