正交晶系
衍射
Crystal(编程语言)
结晶学
材料科学
X射线
X射线晶体学
晶体结构
化学
光学
物理
计算机科学
程序设计语言
作者
Mario E. Rodríguez‐García,Sandra M. Londoño‐Restrepo,Cristian Felipe Ramirez-Gutierrez,Beatriz M. Millán‐Malo
标识
DOI:10.48550/arxiv.1808.02966
摘要
The x-ray diffraction (XRD) patterns reported for starch in the literature describes it as a semicrystalline polymer that indicates that amorphous and crystalline regions form it, and this is commonly accepted. However, these patterns have not been well interpreted according to the XRD theory, and the crystal size effect has been neglected. A simulation of the effect of the crystal size on the shape and width on XRD patterns for A-type (orthorhombic structure, ICDD card No. 00-043-1858) using PDF-4 software shows that the patterns of starches are governed by the elastic and inelastic scattering producing wide peaks. For isolated starches XRD patterns, the separation of inelastic and elastic scattering is not possible, then the calculation of the crystalline percent or crystalline quality does not make any physics sense.
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