物理不可克隆功能
晶体管
材料科学
三元运算
随机性
光电子学
纳米技术
计算机科学
电气工程
计算机硬件
工程类
仲裁人
电压
程序设计语言
统计
数学
作者
Bangjie Shao,Tsz Hin Choy,Feichi Zhou,Jiewei Chen,Cong Wang,Yong Ju Park,Jong‐Hyun Ahn,Yang Chai
出处
期刊:Nano Research
[Springer Science+Business Media]
日期:2020-09-02
卷期号:14 (6): 1784-1788
被引量:26
标识
DOI:10.1007/s12274-020-3033-0
摘要
Physically unclonable crypto primitives have potential applications for anti-counterfeiting, identification, and authentication, which are clone proof and resistant to variously physical attack. Conventional physical unclonable function (PUF) based on Si complementary metal-oxide-semiconductor (CMOS) technologies greatly suffers from entropy loss and bit instability due to noise sensitivity. Here we grow atomically thick MoS2 thin film and fabricate field-effect transistors (FETs). The inherently physical randomness of MoS2 transistors from materials growth and device fabrication process makes it appropriate for the application of PUF device. We perform electrical characterizations of MoS2 FETs, collect the data from 448 devices, and generate PUF keys by splitting drain current at specific levels to evaluate the response performance. Proper selection of splitting threshold enables to generate binary, ternary, and double binary keys. The generated PUF keys exhibit good randomness and uniqueness, providing a possibility for harvesting highly secured PUF devices with two-dimensional materials.
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