均质化(气候)
多晶硅
材料科学
硅
光伏系统
晶体硅
宏
单晶硅
微晶
有限元法
复合材料
MATLAB语言
计算机科学
工程物理
结构工程
图层(电子)
光电子学
冶金
工程类
电气工程
薄膜晶体管
程序设计语言
操作系统
生态学
生物
生物多样性
作者
Martin Weber,Marcus Aßmus,Rainer Glüge,Max von Zabiensky,Holm Altenbach
标识
DOI:10.1002/pamm.202300221
摘要
Abstract A current topic in the photovoltaic industry is the analysis and evaluation of possible structural and material properties. This requires the effective material characteristics of polycrystalline silicon, which is an important component for the functional performance of the photovoltaic modules in use. Since this assessment is associated with high costs, it is to be carried out already in the product development process. Due to very thin silicon layers, the effect of the layer thickness on the effective material characteristics has to be investigated (see ). In this work, a procedure to determine these characteristic values is listed to investigate the size effect on different film thicknesses of this material (see ). With the knowledge of the properties of the silicon single crystal with its cubic symmetry on the micro level, a homogenization of the properties to the macro level can be done. The polycrystal structure with a cubic sample geometry forms the macro level. This structure is now cut into thinning layers for investigation. The open‐source software Neper is used to create the crystal structure and the inter‐connectivity for this purpose. With the help of Matlab, this information is passed on to the finite element program Abaqus, where the results are evaluated after an elastic calculation using Python. The focus is on the expected change in material properties as a function of the layer thickness.
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