钴
材料科学
合金
结晶学
衍射
加工硬化
扫描电子显微镜
堆积
固溶体
钨铬钴合金
相(物质)
电子显微镜
冶金
微观结构
复合材料
光学
化学
物理
有机化学
作者
H. Podlesak,Christian Gläser,B. Wielage,D. Hösel,R. Neugebauer
出处
期刊:Practical Metallography
[De Gruyter]
日期:2012-11-01
卷期号:49 (11): 683-696
摘要
Abstract A detailed microstructural study was carried out using a field emission-scanning electron microscope with the aim of analysing the effect of surface work-hardening which occurs when milling the cobalt based hard facing alloy ”Stellite 12“. The strengthening was determined to be caused by the formation of two-dimensional structural defects in the cobalt solid-solution matrix. The assumption that a stress induced martensitic transformation of the crystalline areas of the cubic cobalt phase into thin hexagonal cobalt platelets occurs was confirmed by X-ray diffraction phase analysis. In addition, it was assumed that stacking faults would be formed. For the microscopic investigation, the channeling effect achieved by imaging using a conventional ring-shaped back scattered electron detector proved most useful. Because of needed high quality of polished sections, an optimised method of preparation was developed.
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