聚合物
材料科学
图层(电子)
产量(工程)
清理
法律工程学
纳米技术
复合材料
工程类
化学
色谱法
萃取(化学)
作者
Tianrui Chen,Wutao Tu,Haiyang Zhang
出处
期刊:Meeting abstracts
[Institute of Physics]
日期:2022-07-07
卷期号:MA2022-01 (28): 1264-1264
标识
DOI:10.1149/ma2022-01281264mtgabs
摘要
In this paper, a two-step clean method for HKMG TiAl protection is discussed, which could improve TiAl damage and make etch-polymer clean. Using Dupont’s EKC580 chemical before traditional HF clean, the TiAl form TiO x protection layer on the surface, then HF cleans etch by-product polymer. The TiAl loss by HF can improve from 37A to 6A after EKC580 clean. The yield performance is hence much improved.
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