光学
材料科学
扫描探针显微镜
温度测量
显微镜
校准
栅栏
近场扫描光学显微镜
光纤布拉格光栅
纳米-
光纤
光学显微镜
光电子学
扫描电子显微镜
物理
复合材料
量子力学
作者
Zhenmin Liu,Na Chen,Shaoying Li,Yong Liu,Yana Shang,Zhenyi Chen,Fufei Pang,Tingyun Wang
出处
期刊:Optics Express
[Optica Publishing Group]
日期:2023-05-16
卷期号:31 (12): 19453-19453
被引量:6
摘要
To accurately measure the local temperatures of the micro-nano area, we propose an optical method using a tapered fiber Bragg grating (FBG) probe with a nano tip for scanning probe microscopy (SPM). When the tapered FBG probe senses local temperature through near-field heat transfer, the intensity of the reflected spectrum decreases, along with a broadening bandwidth and a shift in the central peak position. Modeling the heat transfer between the probe and the sample shows that the tapered FBG probe is in a non-uniform temperature field when approaching the sample surface. Simulation of the probe’s reflection spectrum reveals that the central peak position shifts nonlinearly with increasing local temperature. In addition, the near-field temperature calibration experiments show that the temperature sensitivity of the FBG probe increases nonlinearly from 6.2 pm/°C to 9.4 pm/°C as the sample surface temperature increases from 25.3°C to 160.4°C. The agreement of the experimental results with the theory and the reproducibility demonstrate that this method offers a promising approach for exploring micro-nano temperature.
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