光学
显微镜
傅里叶变换
材料科学
分辨率(逻辑)
摄影术
数字微镜装置
光学显微镜
衍射
计算机科学
物理
扫描电子显微镜
量子力学
人工智能
作者
Van Huan Pham,Byong Hyuk Chon,Hee Kyung Ahn
标识
DOI:10.1117/1.oe.62.4.044106
摘要
We propose a tunable reflective Fourier ptychographic microscopy approach in which the resolution and field of view are variable with different objective lenses and a digital micromirror device. Several objective lenses are applied to tunable reflective Fourier ptychographic microscopy without additional optical alignment while also enhancing the resolution. To demonstrate the feasibility of the new technique, tunable reflective Fourier ptychographic microscopy with 10 × and 50 × objective lenses is demonstrated. Moreover, we compare the resolution of the new technique and conventional Fourier ptychographic microscopy to verify the improved resolution of the new technique.
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