绝对相位
相(物质)
相位展开
结构光三维扫描仪
光学
计算机科学
轮廓仪
投影(关系代数)
直方图
相位恢复
人工智能
底纹
计算机视觉
干涉测量
数学
算法
图像(数学)
物理
相位噪声
计算机图形学(图像)
傅里叶变换
材料科学
表面光洁度
数学分析
量子力学
复合材料
扫描仪
作者
Yu‐Chen Hu,Minghui Duan,Yi Jin,Changan Zhu,Enhong Chen,Chunmei Xu
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2021-03-23
卷期号:46 (8): 1955-1955
被引量:11
摘要
Absolute phase unwrapping in the phase-shifting profilometry (PSP) is significant for dynamic 3-D measurements over a large depth range. Among traditional phase unwrapping methods, spatial phase unwrapping can only retrieve a relative phase map, and temporal phase unwrapping requires auxiliary projection sequences. We propose a shading-based absolute phase unwrapping (SAPU) framework for in situ 3-D measurements without additional projection patterns. First, the wrapped phase map is calculated from three captured images. Then, the continuous relative phase map is obtained using the phase histogram check (PHC), from which the absolute phase map candidates are derived with different fringe orders. Finally, the correct absolute phase map candidate can be determined without additional patterns or spatial references by applying the shading matching check (SMC). The experimental results demonstrate the validity of the proposed method.
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