Overview and emerging challenges in mechanical dicing of silicon wafers
作者
V.P. Ganesh,Charles Lee
标识
DOI:10.1109/eptc.2006.342684
摘要
An overview and emerging challenges in mechanical dicing of silicon (Si) wafer are discussed from view point of narrow kerf, thin wafer, chip strength enhancement, Copper (Cu)/low-k wafers and dicing challenges for emerging technologies.