恒相元件
电容
材料科学
航程(航空)
电阻率和电导率
相(物质)
常量(计算机编程)
分布(数学)
机械
电极
数学分析
复合材料
电容式探头
数学
化学
物理
电化学
计算机科学
介电谱
物理化学
量子力学
有机化学
程序设计语言
作者
Bryan Hirschorn,Mark E. Orazem,Bernard Tribollet,Vincent Vivier,Isabelle Frateur,Marco Musiani
标识
DOI:10.1016/j.electacta.2009.10.065
摘要
Two different mathematical formulas for estimating effective capacitance from Constant-Phase-Element (CPE) parameters, taken from the literature, are associated unambiguously with either surface or normal time-constant distributions. Application to different systems are used to illustrate the importance of using the correct formula that corresponds to a given type of distribution. Experiments and simulations are used to show that the effective capacitance obtained for a normal distribution yields correct values for the film thickness under conditions where the local resistivity does not vary significantly. When the local resistivity varies considerably over the thickness of a film, the experimental frequency range may preclude observation of the capacitance contribution of a portion of the film, resulting in under prediction of the film thickness.
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