期刊:Applied Physics Letters [American Institute of Physics] 日期:1982-08-01卷期号:41 (3): 211-212被引量:357
标识
DOI:10.1063/1.93485
摘要
We report the construction of a sensitive electro-optic sampling system for the measurement of ultrafast electrical transients. This system has a temporal resolution of lessthan 4 ps (over 100- GHz bandwidth), better than 50-μV sensitivity and potential for a temporal resolution reaching the single picosecond. Demonstrated applications are ultrafast photodetector response characterization and time resolved photoconductivity.