纳米团簇
扫描透射电子显微镜
纳米颗粒
透射电子显微镜
暗场显微术
电子断层摄影术
原子层沉积
材料科学
纳米技术
金属有机骨架
扫描电子显微镜
直接成像
沉积(地质)
图层(电子)
原子单位
纳米尺度
表征(材料科学)
显微镜
化学
光学
复合材料
物理
吸附
物理化学
古生物学
生物
量子力学
沉积物
作者
Maria Meledina,Stuart Turner,Maria Filippousi,Karen Leus,Iván Lobato,Ranjith K. Ramachandran,Jolien Dendooven,Christophe Detavernier,Pascal Van Der Voort,Gustaaf Van Tendeloo
标识
DOI:10.1002/ppsc.201500252
摘要
MIL‐101 giant‐pore metal‐organic framework (MOF) materials have been loaded with Pt nanoparticles using atomic layer deposition. The final structure has been investigated by aberration‐corrected annular dark‐field scanning transmission electron microscopy under strictly controlled low‐dose conditions. By combining the acquired experimental data with image simulations, the position of the small clusters within the individual pores of a metal‐organic framework has been determined. The embedding of the Pt nanoparticles is confirmed by electron tomography, which shows a distinct ordering of the highly uniform Pt nanoparticles. The results show that atomic layer deposition is particularly well‐suited for the deposition of individual nanoparticles inside MOF framework pores and that, upon proper regulation of the incident electron dose, annular dark‐field scanning transmission electron microscopy is a powerful tool for the characterization of this type of materials at a local scale.
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