Wavelet Processing of Palladium Foil Images from Atomic Force Microscopy (AFM) Measurements

Discrete wavelet image processing techniques are applied to AFM images of Palladium for improving image quality. In this paper Discrete Wavelet Transforms (DWT) are used to process AFM images to minimize the noise introduced by AFM instrumentation errors. The smallest of mechanical and electrical errors from the AFM introduces noise into the images. We will use the DWT to reduce noise and to compress the image size. Wavelet denoising can remove gaussian noise as well as nonlinearly generated instrumentation noise, and wavelet compression greatly reduces the number of pixels required to store a large number of images.