硒化铜铟镓太阳电池
纤锌矿晶体结构
开路电压
量子效率
太阳能电池
光电子学
带隙
材料科学
图层(电子)
薄膜
透射率
分析化学(期刊)
锌
化学
电压
纳米技术
物理
色谱法
量子力学
冶金
作者
Akihiro Funaki,Fumiya Furumaki,Takahito Nishimura,Akira Yamada
标识
DOI:10.35848/1347-4065/acc954
摘要
Abstract A Zn(O, S) thin-film is deposited utilizing an open-air CVD method by evaporating zinc-diethyldithiocarbamate, which is a non-vacuum and dry process. In an X-ray diffraction measurement, it is revealed that the films have a wurtzite structure and an [O]/([O] + [S]) ratio of 10%. A bandgap energy of 3.1 eV is estimated from the transmittance and reflectance spectra. By applying the Zn(O, S) as an n-type buffer layer, Cu(In, Ga)Se 2 solar cells are fabricated. In the current density–voltage characteristics, distortion is observed at the bias voltages above the open-circuit voltage. It is implied that a large conduction band offset exists at a Zn(O, S)/CIGS interface. A quantum efficiency spectrum in the wavelength region of 380–512 nm is improved compared to a traditional CdS buffer layer. Finally, a 9.2%-efficient CIGS solar cell is demonstrated utilizing the Zn(O, S) buffer layer through an all-dry process.
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