X射线光电子能谱
电解质
电化学
表征(材料科学)
电极
材料科学
薄膜
分析化学(期刊)
纳米技术
化学
化学工程
物理化学
工程类
色谱法
作者
Sheena Louisia,Marc T. M. Koper,Rik V. Mom
标识
DOI:10.1016/j.coelec.2024.101462
摘要
X-ray spectroscopies provide a powerful way to disentangle the roles of the different elements in electrochemical systems. Within this family of spectroscopies, electrochemical X-ray photoelectron spectroscopy (EC-XPS) has recently emerged as a technique that can specifically probe the heart of any electrochemical process: the electrode-electrolyte interface. Here, we discuss the current state-of-the-art of EC-XPS and review the practical implementation of the measurements. We identify three principal categories of EC-XPS approaches: quasi in situ, thin electrolyte, and thin electrode. As each presents distinct advantages and drawbacks, we highlight the importance of matching the electrochemical system of interest with the most suitable approach.
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