光学
Scheimpflug原理
失真(音乐)
投影(关系代数)
结构光三维扫描仪
轮廓仪
计量学
物理
材料科学
计算机科学
算法
表面粗糙度
量子力学
光电子学
CMOS芯片
放大器
角膜
扫描仪
作者
Sudong Ding,Ziqiang Wei,Yan Hu,Wenhui Li,Shichao Gao,Li Zhang,Qian Chen,Chao Zuo
出处
期刊:Optics Letters
[The Optical Society]
日期:2025-07-17
卷期号:50 (16): 5077-5077
摘要
Microscopic fringe projection profilometry (MFPP) has become an essential technique for precisely inspecting intricate microscale industrial parts, where Scheimpflug multi-view imaging is commonly used to extend the depth of field (DOF). However, lens distortion significantly reduces measurement accuracy, creating a major challenge for seamlessly fusing data from different views. In this Letter, we introduce a non-iterative distortion correction method for Scheimpflug multi-view MFPP that directly remaps camera and projector pixels using pre-calibrated parameters. The undistorted position for unidirectional fringes is calculated by intersecting undistorted camera sight lines with a sub-pixel-interpolated DMD grid, thereby eliminating the need for pattern reloading or iterative optimization. Experiments with a dual Scheimpflug camera MFPP system show that the proposed approach decreases the root-mean-square error (RMSE) of 3D measurements for planes and standard spheres by 43.5% and 21.1%, respectively. Additionally, reconstructing a complex aircraft model demonstrates the method’s ability for seamless multi-view fusion, providing a computationally efficient and accurate solution for micro-scale 3D metrology.
科研通智能强力驱动
Strongly Powered by AbleSci AI