X射线光电子能谱
材料科学
兴奋剂
氧气
共焦
分析化学（期刊）
矿物学
结晶学
光电子学
化学
光学
核磁共振
物理
有机化学
色谱法
作者
J.L. Clabel H.,Iram Taj Awan,G. Lozano C.,Marcelo A. Pereira‐da‐Silva,Renan Arnon Romano,V.A.G. Rivera,Sukarno Olavo Ferreira,E. Marega
摘要
Optical activation and chemical defects were identified with the help of confocal scanning microscopy on films with nano-scale thickness, which was in agreement with SEM measurements, and supported by X-ray photoelectron spectroscopy.
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