结晶
晶体生长
晶种
衍射
材料科学
结晶学
成核
Crystal(编程语言)
光学显微镜
表征(材料科学)
分辨率(逻辑)
化学物理
光学
化学
纳米技术
单晶
扫描电子显微镜
复合材料
计算机科学
物理
人工智能
程序设计语言
有机化学
作者
Tomasz Sochacki,Robert Kucharski,Karolina Grabiańska,J.L. Weyher,Małgorzata Iwińska,Michał Boćkowski,Lutz Kirste
出处
期刊:Materials
[MDPI AG]
日期:2022-06-30
卷期号:15 (13): 4621-4621
被引量:6
摘要
In this paper, a detailed investigation of the basic ammonothermal growth process of GaN is presented. By analyzing the crystallization on a native seed with a lenticular shape, thus with an intentionally varying off-cut, we wanted to answer some basic questions: (i) Which crystallographic planes play the most important role during growth (which planes are formed and which disappear)? (ii) What is the relationship between the growth rates in different crystallographic directions? (iii) What is the influence of the off-cut of the seed on the growth process? Two non-polar slices, namely, 12¯10 and 1¯100, as well as a 0001 basal plane slice of an ammonothermal crystal were analyzed. The examined planes were selectively etched in order to reveal the characteristic features of the growth process. The applied characterization methods included: optical microscopy with Nomarski contrast and ultraviolet illumination, X-ray topography and high-resolution X-ray diffraction, and secondary ion mass spectrometry. The obtained results allowed for creating a growth model of an ammonothermal GaN crystal on a lenticular seed. These findings are of great importance for the general understanding of the basic ammonothermal crystal growth process of GaN.
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